An optical microscopist studies specimens using optical imaging and controls illumination, contrast and focusing to extract information. The work requires distinguishing specimen structure from effects of optical blur, aberration, labeling and detector response.
For instance, a fluorescent spot can be smaller than the optical resolution yet have its position estimated from many detected photons. Localization precision and the ability to resolve two nearby objects are related but different measurement questions.
Thomas J. Fellers is credited with Michael W. Davidson as an author of Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson, an educational account of quantitative optical microscopy. Its byline associates the authors with the National High Magnetic field Laboratory at Florida State University. [ref]
Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson. Contributing Authors byline
The account explains how a stage micrometer calibrates an eyepiece reticle. Matching a known specimen-plane length to reticle divisions converts an arbitrary scale into a physical measurement. Changing the objective lens changes that calibration, so magnification alone is insufficient for reliable microscopy. The article also discusses optical resolution and errors in locating scale edges. [ref]
Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson. Eyepiece Reticle Calibration, Figure 4; Conclusions
Articles by others on the same topic
There are currently no matching articles.