A competitive index measures the change in the relative representation of two competing biological strains. With test strain $T$ and reference strain $R$, a common convention iswhere input and output denote abundances measured before and after the comparison. The order of the two biological strains must be stated: swapping them gives the reciprocal when all four abundances are positive.^[ref]

An original numerical example starts with 100 test and 100 reference units and ends with 200 test and 800 reference units. Then $\mathrm{CI}=(200/800)/(100/100)=0.25$. The test strain doubled in absolute abundance while declining fourfold relative to the reference. If the input had instead been 100 test and 400 reference units, that same output would give $\mathrm{CI}=1$. Input normalization therefore matters.

The measurement can connect a molecular difference to microbial ecology. A primary study compared a proline-fermenting bacterial strain with a mutant unable to perform that fermentation, then tested how additional community members changed their relative recovery. The observed advantage depended on the surrounding community and medium.^[ref]

An index above one favors the strain placed in the numerator for that comparison. It is not a context-independent measure of biological fitness. The abundance assay, reference strain, sampling interval and environment define the question. Counts of colony-forming units, for example, measure recoverable colony-producing units under the assay conditions. Zero reference counts make the displayed ratio undefined; substituting an arbitrary number changes the statistic.

Manufacturer technical article, byline Minco Staff. Opening paragraphs define the 63.2% response criterion, describe rapid immersion from room temperature into heated water or oil, and distinguish a uniform thermal lump from more complicated assemblies. The paragraph beginning “For a rigorous approach” requires conversion of sensor output to temperature before evaluating response.

June 1992 handbook, DOE-HDBK-1013/1-92. Module 1, Temperature Detectors, printed pp. 1–9, describes resistance and thermocouple sensing, probe construction, protective wells and environmental influences. Used here for basic sensing principles, rather than as a current operating standard.

Section 2 discusses reference-junction thermal conditions. Section 6, p. 17, gives the compensation calculation; section 7, pp. 20–21, distinguishes varying the reference-junction temperature from varying the measurement-junction temperature. Section 9, p. 23, identifies both authors and their engineering roles at the time of publication.

Additional precise apparatus locator: Section 7, printed p. 20, Figure 17 places the ADS1118 EVM and reference junction in an oven or controlled thermal environment while the measurement junction stays at a fixed bath temperature; the USB interface and cable remain outside. Printed pp. 5–6 separately require isothermal terminal transitions and close thermal sensing, with metal-fill layout and airflow considerations. These are the physical controls used to distinguish compensation error from a changed measurement-junction temperature. www.ti.com/lit/ug/slau509/slau509.pdf

Additional cited passage: §4, printed p. 15, Figure 11, component placement, copper regions and thermal isolation of the converter/reference-junction region from nearby heat sources. ^[ref]

The first-page abstract and the discussion of low-pass filter design explain why signal and reference filters must have matching responses to retain excitation-noise cancellation.

Additional cited passages: §§3.1–3.2, printed pp. 6–9, Figures 3-1–3-4, resistance-decade-box noise tests comparing reference-only filtering with matched signal/reference filters. The mismatched-filter experiment uses 1 mA excitation, a 2 kΩ reference, gain eight and 20 samples per second. ^[ref]

Additional cited passage: §3.4, printed p. 11, and Table 3-1, electrical settling after excitation activation and before acquisition; the table expresses resolution-dependent settling requirements in RC time constants. ^[ref]

Section 2.1.3, printed pp. 10–11, shows the shared-current reference resistor and explains reference accuracy, lead resistance and sensor self-heating.

Additional cited passages: §2.1.4, printed p. 11, equations (17)–(18), digital conversion proportional to gain times the sensor/reference resistance ratio; §2.1.3, printed p. 11, the Kelvin connection at the reference terminals excludes series connection resistance from the measured reference potential difference. ^[ref]

Additional cited passages: §§1.4.1–1.4.2, printed pp. 5–6, Figures 1-5–1-6 and equations (6)–(12), three-wire lead-resistance cancellation and swapping the two excitation sources to reduce mismatch. The averaging rule is specific to that circuit topology. ^[ref]

Title page: John D. Ramboz and Oskars Petersons, NIST, June 1991. Section 1.2, printed pp.4–5, Figure 2 and equation 2: equivalent circuit. Section 1.3, printed pp.5–6: marked/true ratios, ratio correction factor and lead-positive phase angle.

Additional apparatus locator: section 2.1, Calibration Circuits, printed pages 12–15, Figures 8–9, describes current-transformer calibration with a compensated current comparator in secondary-feed and primary-feed arrangements. nvlpubs.nist.gov/nistpubs/Legacy/SP/nistspecialpublication250-36.pdf

Primary source: www.bipm.org/documents/20126/2071204/JCGM_101_2008_E.pdf

Verified locator: JCGM 101:2008, first edition. Full title Evaluation of measurement data — Supplement 1 to the Guide to the expression of uncertainty in measurement — Propagation of distributions using a Monte Carlo method. §§5.1–5.2 distinguish assigning the input model from propagating distributions; §5.10 gives conditions for valid Monte Carlo use; §6.1 addresses input probability distributions; §6.5 addresses uncertainty information from a previous uncertainty evaluation; §7 describes numerical implementation.

Primary dimensional standard. Foreword: automation compatibility and standardization history. Sections1.2 and4.1.1.1–4.1.1.2: reference temperature and location-dependent footprint tolerances. Secretariat: Society for Laboratory Automation and Screening.

Primary source: publications.iupac.org/pac/78/1/0145/index.html

Verified locator: Pure and Applied Chemistry 78, 145–196 (2006), DOI 10.1351/pac200678010145. Full primary report inspected via governmental mirror www.sfda.gov.sa/sites/default/files/pdfs-files/HarmonisedProtocolProficiencyTesting.pdf . Byline Michael Thompson, Stephen L. R. Ellison and Roger Wood. Appendix 1 A1.1 printed p. 177 recommends at least ten random containers and duplicate test portions in randomized measurement order; A1.2 gives ANOVA estimates; §3.11.2 p. 171 distinguishes sufficient homogeneity from zero sampling variance.

Measurement-order locators: Appendix 1, A1.1 (printed p. 177) requires randomized analysis of duplicate portions and checks for suspect trends; A1.3 (printed pp. 179–180) gives detailed laboratory instructions, including randomized order for the analytical operations. These support separating material variation from time-dependent analytical effects. Inspected primary report mirror: www.sfda.gov.sa/sites/default/files/pdfs-files/HarmonisedProtocolProficiencyTesting.pdf .

Primary source: www.nist.gov/document/mono180pdf

Verified locator: NIST Monograph 180, 1995; inspected corrected handbook. Preface names Ted Doiron and John Beers; official NIST publication record identifies Theodore D. Doiron and John S. Beers. §§2.2.2 and 6.1 define length using a wrung auxiliary plane and the wringing-layer convention; §5.3 mechanical comparison, §5.4.3.1 Eq. 5.8 thermal correction, §6.2 interferometers. Publication record: www.nist.gov/publications/gage-block-handbook .

Preface, printed p. iii (PDF p. 1), attributes the single-wavelength interferometry discussion to John Beers and the measurement-assurance program changes represented in Chapter 4 to author TD. The handbook preface uses Ted Doiron; the official NIST record for this same publication gives Theodore D. Doiron. The source title retains its published Ted spelling.

Additional wringing locators: Appendix B, Gauge Block Wringing, printed pp. 138–139, explains why atmospheric pressure alone is inadequate, describes fluid-dependent adhesion and time-varying contact layers, and discusses the defined-length convention. Section 3.2.1 describes inspecting a block wrung to a transparent optical flat for uniform contact appearance. Primary corrected handbook: www.nist.gov/document/mono180pdf .

Additional uncertainty/design locators: §4.4.3, Calculating the total uncertainty, separates information from the interferometric master history and comparison-process variability; §5.6.1 describes drift-eliminating observation designs. These support retaining a shared reference contribution and using an explicit observation-order model. www.nist.gov/document/mono180pdf .

Manufacturer application description: a non-contact tachometer illuminates reflective tape on a rotating fan and counts the reflected-light pulses. The indexed primary page verifies that apparatus and pulse-counting principle. Direct page retrieval returned HTTP 403; no unavailable manual details or current performance specification are inferred.