 Phase retardation

For the overlapping monochromatic wave components, let $d$ be the thickness and ${\lambda }_0$ the vacuum wavelength. Define $\Delta n=n_s-n_f>0$ using the slow and fast refractive indices. With complex amplitude convention $e^{i(kz-\omega t)}$, the accumulated slow-minus-fast phase difference isThis is the optical path difference $\Delta nd$ expressed as a wave phase. It is a signed accumulation convention; with the opposite time convention the sign reverses. The outgoing polarization of an electromagnetic wave depends on $\delta$ modulo $2\pi$. Here the positive slow-minus-fast $\Delta n$ differs from the signed principal-index $n_e-n_o$ used in the parent birefringence entry when $n_e<n_o$.

For an original worked example, stipulate $\Delta n=0.0100$ at ${\lambda }_0=600\mathrm{nm}$ and a uniform thickness $d=15.0\mu \mathrm{m}$. These are design assumptions, not measured material data. The optical path difference is $150\mathrm{nm}$, soIt is a quarter-wave plate. At the same wavelength and refractive indices, doubling $d$ to $30.0\mu \mathrm{m}$ gives $\delta =\pi$, a half-wave plate. A $1.0\mu \mathrm{m}$ thickness increase changes $\delta$ by $\pi /30$, or $6^{\circ }$; retaining the same birefringence at $500\mathrm{nm}$ would instead give $\delta =3\pi /5$ for the $15.0\mu \mathrm{m}$ plate. Real refractive indices also vary with wavelength, so this last calculation explicitly neglects optical dispersion.

For these equal transmitted wave amplitudes, orthogonal projection onto a polarizer crossed with the initial $45^{\circ }$ linear polarization gives a simple independent readout. After removing a common wave phase, the component complex amplitudes are proportional to $(1,e^{i\delta })/\sqrt{2}$; orthogonal projection onto $(1,-1)/\sqrt{2}$ gives $(1-e^{i\delta })/2$. Squaring its modulus yields $I_{\perp }/I_{\mathrm{in}}={\sin }^2(\delta /2)$: zero at $d=0$, one half at $15\mu \mathrm{m}$, and one at $30\mu \mathrm{m}$. This assumes ideal polarizers, negligible specular reflection and wave absorption, overlapping components and stable relative wave phase. It measures a periodic function of phase retardation, so one brightness measurement cannot determine the thickness uniquely.