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An absorption edge is an abrupt change in photon absorption as incident photon energy crosses an electronic excitation threshold. For inner-shell photoionization, a new vacancy-production channel opens near the shell's binding energy. This threshold concerns incident energy; a Characteristic X-ray concerns a subsequent difference of atomic energies. They are different observations. Barkla's lecture explicitly treats characteristic emission as requiring a critical excitation condition, while discussing characteristic radiation separately from scattering.^[ref]

In the stipulated X-ray fluorescence model, the K threshold is $10.0\mathrm{keV}$, whereas the K lines are $8.5$ and $9.7\mathrm{keV}$. An absorber made of a different material could have its own absorption edge between those line energies, preferentially removing the upper line. Actual near-edge structure and attenuation values require material data; the following deliberately chosen coefficients are not such data.

The incident X-ray drives the electrons of an atom. Away from an absorption edge, and when the photon energy greatly exceeds the relevant electronic binding energies but is small compared with $m_e{c}^2$, each electron has approximately the same Thomson scattering amplitude. The much heavier nucleus makes a negligible contribution because its acceleration is much smaller.

For elastic scattering, the amplitudes from different bound electrons add coherently. In units of the single-electron amplitude, the atomic scattering factor is the Fourier transform of the bound-electron number density:Consequently, when the electron cloud is not well resolved by the scattering vector, its internal phase differences are small andThis is an approximation to the coherent scattering amplitude, not an assertion that independently scattered intensities add as $N_e$. At larger momentum transfer, destructive interference within the cloud reduces $f$; near absorption edges, the atomic scattering factor acquires dispersive corrections. Inelastic scattering is a separate contribution. In an ionic crystal, use the ion's bound-electron count rather than automatically using the neutral atom's atomic number.

The sixth allowed family is $400$. For the two lattice constants, use $2{\theta }_{400}=2{\sin }^{-1}(2\lambda /a)$:ConsequentlyThe larger lattice constant shifts the AlAs reflection to lower scattering angle. As a differential check, $\Delta (2\theta )\simeq -2\tan \theta \Delta a/a$ in radians.

If the angular displacement is unresolved, use the intensity contrast. With the same $f\simeq Z$ model, a difference reflection has basis amplitude $13-33=-20$ for AlAs, versus $31-33=-2$ for GaAs. Its squared amplitude is therefore one hundred times greater before overall sample normalization. More robustly, compare a weak and a strong reflection within each specimen. Neglecting their almost identical angular corrections,The contrast in this internal ratio is about a factor $194$. Element-specific X-ray fluorescence, for example testing for a Ga characteristic line with a suitably energetic incident beam, or an X-ray absorption spectroscopy scan through an element-specific absorption edge, also distinguishes composition. Such scans can change incident energy; one must not assume every core shell can be excited by the original $8\mathrm{keV}$ beam.

Both neutron diffraction and X-ray diffraction use interference from atomic arrangements. Elastic scattering gives reciprocal-space peaks when the momentum transfer matches a reciprocal lattice vector. For a basis with sites ${\mathbf{r}}_j$, the structural amplitude is $F(\mathbf{Q})={\sum }_j{b}_j(\mathbf{Q})e^{i\mathbf{Q}\cdot {\mathbf{r}}_j}$, and peak intensities constrain positions, occupancies and thermal displacement as well as lattice symmetry. Powder averaging loses some directional information that a suitable single-crystal measurement retains.

X-rays couple primarily to the electron distribution. Their atomic form factors generally favor heavier atoms and decrease with increasing scattering angle; the wavelength can also be tuned near an absorption edge for element-sensitive anomalous contrast. Neutrons scatter from nuclei with scattering lengths that vary irregularly with element and isotope. This can make light atoms visible beside heavy ones, and isotope substitution can change contrast without changing the nominal chemical element. In particular, replacing hydrogen with deuterium changes the balance of coherent and incoherent neutron scattering.

Neutron magnetic scattering also couples to electronic magnetic moments, allowing magnetic order to produce peaks distinct from the nuclear structure. X-ray magnetic scattering is possible too, especially under suitable resonant conditions; it is incorrect to say X-rays can never probe magnetism. Neutron experiments often require larger samples and dedicated sources, whereas X-ray scattering is available in laboratories as well as synchrotrons. Absorption, multiple scattering, texture and instrumental resolution affect both methods. Their complementarity comes from different contrast weights and magnetic sensitivity, rather than from two identical pictures of the same density.

In photoemission electron microscopy, illuminate a surface with ultraviolet light or X-rays and form an electron-optical image of the emitted electrons. An extraction field accelerates them away from the sample; an immersion objective and projection lenses magnify their spatial distribution onto an electron detector. Unlike a scanned probe, this is a full-field image. Surface preparation and vacuum matter because the emitted low-energy electrons are strongly affected by contamination and local electric fields.

Contrast can come from work-function differences, composition, occupied electronic states, illumination and topography. Near threshold, a small work-function change can produce a large emission-yield change. Therefore brightness is not simply geometrical height. An energy filter can select an emitted-electron energy interval; scanning the selection yields spatially resolved spectra. Sweeping the photon energy across an absorption edge can add element and chemical-state sensitivity. Appropriate polarization-dependent measurements can probe magnetic domains.^[ref]

Resolution depends on electron-lens aberrations, the accepted angular and energy spread, extraction geometry, sample flatness, space charge, mechanical stability and detector sampling. Rejecting electrons improves some aberrations at a cost in signal. An unfiltered photoelectron image and a chemically selected image therefore answer different questions even when they use the same microscope.