Detector linearity describes how consistently a detector's corrected output remains proportional to input over a stated range and under specified conditions. For optical power and output , an affine measurement model is , where is background and is constant. After background subtraction, doubling power should double output. A change in detector responsivity with input level is evidence of departure from that proportional relation.
For an original two-level test, suppose independently established powers are and . A background reading is , while illuminated readings are and . Define the response ratioThe second corrected output is below the doubling expected from the first. Ignoring the background would instead give , confusing offset with nonlinearity. These are stipulated teaching readings, not measured performance of a named detector.
A primary apparatus example is NIST's characterization of a photodiode at . It reports responsivity relative to the low-power value, using a beam splitter to illuminate two photodiodes at about a intensity ratio, with the detector aperture uniformly filled. The report explicitly notes that the observed linearity depends on irradiation geometry.[ref]
Spectroradiometric Detector Measurements: Ultraviolet, Visible, and Near-Infrared Detectors for Spectral Power by Thomas C. Larason and others. 2008edition, §9.1, printed pp85–86, linearity method and Figure9.2
A useful test therefore controls wavelength, beam position and size, bias, temperature, readout gain and source stability while changing input level. Reference-detector nonlinearity or a changing beam ratio can imitate nonlinearity of the test detector. Quantify the uncertainty in the comparison before interpreting a small response-ratio departure.
Detector saturation is a strong limiting case, but detectable nonlinearity can arise before the output becomes flat. A satisfactory response ratio at two levels also does not establish detector linearity over every intermediate level or different operating conditions. Record the tested range and the reference relation with the measurement result.
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