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In a diffusion-dominated p-n junction, $I_s=C(T)n_i^2$ with a transport prefactor determined by minority-carrier diffusion and dopant densities. Combining this with the intrinsic carrier concentration gives, for fixed gap and effective masses,The slope against $1/T$ is $-E_g/k_B$. A measured diode ideality factor helps identify the transport regime: generation or recombination current can have a different dependence on $n_i$, so its activation slope cannot automatically be interpreted with the diffusion formula.

An ideal diffusion-dominated p-n junction obeys the Shockley diode equationwith diode ideality factor $\eta =1$ in the simplest model. Forward bias gives exponential current growth; reverse bias gives a nearly constant $-I_s$ until diode reverse breakdown, outside this ideal expression.

For a long abrupt p-n junction in low carrier injection, the diode saturation current isHere $\mathcal{A}$ is area, $N_D,N_A$ are ionized dopant densities, and $D,L$ are minority-carrier diffusion coefficients and diffusion lengths in the appropriate regions. At each temperature, extract $I_s$ either from the reverse-saturation plateau below breakdown or from a forward exponential fit using its measured diode ideality factor.

Extracting a semiconductor band gap from diode saturation current requires correcting for the transport prefactor:A plot against $1/T$ has slope $-E_g/k_B$ when the gap and effective masses are nearly temperature-independent. Alternatively divide the measured $I_s$ by a known $C(T)$ to recover the full $n_i^2(T)$. The prefactor cannot generally be assumed constant over an arbitrarily broad range. Junction-generation or recombination-dominated current can scale as $n_i$ instead, so the diffusion regime should be identified from the current-voltage behaviour.

For a p-n junction at fixed temperature, the Shockley diode equation models its electric current asHere $I_S>0$ is the diode saturation current, $n>0$ the diode ideality factor, $V_T$ the thermal voltage, $k_B$ the Boltzmann constant, and $q>0$ the elementary charge.^[ref]

For an original model example, choose $I_S=1\mathrm{nA}$, $n=2$, and $T=300\mathrm{K}$. Using $k_B=1.380649\times 10^{-23}J/K$ and $q=1.602176634\times 10^{-19}\mathrm{C}$ gives $V_T=25.8520\mathrm{mV}$. Then $V_D=0.600\mathrm{V}$ gives $I_D=0.109591\mathrm{mA}$, whereas $V_D=0.800\mathrm{V}$ gives $I_D=5.24450\mathrm{mA}$. These are predictions of the declared model. There is no universal turn-on electric potential difference: solving the Shockley diode equation for the value needed at a chosen electric current givesAt $I_D\gg I_S$, increasing $V_D$ by $0.100\mathrm{V}$ multiplies the electric current by approximately $e^{0.100/(n{V}_T)}=6.91772$. At $V_D=-0.300\mathrm{V}$ the same model gives $I_D=-0.996979\mathrm{nA}$. Its reverse branch approaches $-I_S$; it cannot describe diode reverse breakdown.

A constructed extension adds internal series electrical resistance $R_s$ to a junction whose electric potential difference is $V_j$. Applying the Kirchhoff cycle law givesFor $R_s=20\Omega$ and the same $I_S,n,T$, sustaining $I_D=5.24450\mathrm{mA}$ needs $V_D=0.904890\mathrm{V}$: $0.800\mathrm{V}$ across the junction plus $0.104890\mathrm{V}$ across its internal electrical resistance. The derivativeshows why the current-voltage characteristic becomes nearly a straight line when the internal series electrical resistance dominates. This is still a fixed-temperature model; self-heating can change $I_S$, $n$ and $V_T$. Real diodes also have leakage and charge-storage effects omitted here.^[ref]