A single optical shift represents pressure only to the extent that the calibration's mechanical and thermal conditions apply. Under hydrostatic stress, all directions have the same compressive normal stress. Under deviatoric stress, differently oriented ruby grains can respond differently; spatially varying pressure can also superpose shifted lines. These mechanisms can produce different optical signals at equal mean pressure.[ref]
Stress Measurements in Alumina by Optical Fluorescence: Revisited by Robert F. Cook and Chris A. Michaels. Sections 1–2: stress-sensitive fluorescence shifts and crystallographic stress components
The 2001 account describes scanning local line positions and measuring line width over an extended region. The former resolves spatial differences; the latter supplies a rapid warning.[ref]
High Pressure X-Ray Crystallography With the Diamond Cell at NIST⁄NBS by Gasper J. Piermarini. Section 4.2, Methods I and II
Neither a broadened line nor a narrow one uniquely determines the stress tensor. Instrument resolution, temperature variation and unresolved overlapping signals can also affect width. A small observed region can have a narrow line while differing from another region. Compare locations, reference traces and instrument settings before treating width as evidence for a particular mechanical explanation. These are proposed diagnostic checks, not additional historical controls attributed to the 1975 experiment.
Temperature is another independent input. A useful local expansion is : one measured shift cannot determine both unknowns. Measure or control temperature, or supply a second independently calibrated observable. The coefficients need not remain constant across a large range. Even when a pressure sensitivity transfers over some temperatures, the reference line, line width and practical readout quality can change.
The historical high-temperature account reports degrading pressure measurement quality above about .[ref]
High Pressure X-Ray Crystallography With the Diamond Cell at NIST⁄NBS by Gasper J. Piermarini. Section 4.1, high-temperature cell and readout-quality discussion
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