The institution-issued AY 105 Lab Experiment 3: Optical aberrations by California Institute of Technology (Spring 2011 offering, Part A, pp. 2–3, 7–8) specifies a concrete optical bench: a lamp, opal diffuser and condensing optical lens illuminate a or optical pinhole; a photographic telephoto optical lens acts as a collimator, producing an approximately beam. A test optical lens sits on a rotation stage, followed by an adjustable optical microscope. The procedure establishes the on-axis image, then rotates the test optical lens a few degrees and examines the off-axis image through optical focus. It compares this readout with through-focus ray tracing at the corresponding field angles and offers a Ronchi ruling to calibrate the measuring eyepiece.
Part B (pp. 9–10) substitutes a spherical mirror of radius of curvature, with the optical microscope beside the incoming beam so the image is necessarily off-axis. It calls for measuring the field angle, calibrating the eyepiece and recording the image's length and width at minimum size. These are specified apparatus dimensions and instructions, not supplied measurement results or dimensions of the normalized figures.
A controlled extension would record images at zero and equal positive and negative field angles, repeat zero afterwards, and scan through optical focus at every setting. Keep the illuminated optical pupil and illumination fixed, recenter the optical microscope without clipping the bundle, and use its calibrated scale to separate a mere image displacement from a change in blur shape. The pure Seidel coma pupil mapping predicts reversal and linear growth; a stationary asymmetric central image instead calls for checking alignment. A focus-dependent change between perpendicular elongations suggests an astigmatism contribution. These comparisons test the model rather than assuming every off-axis flare is pure coma.
The optical pinhole has finite angular size, approximately its diameter divided by the collimator's focal length; the collimator and observing optical microscope also contribute their own optical aberrations. A broadband lamp can mix chromatic aberration with the geometric blur, and diffraction limits the smallest visible structure. A narrow spectral band, repeated field settings and a reference image help separate these effects. Consequently a measured length and width are useful checks on off-axis image formation, but they cannot by themselves determine a unique coma coefficient or recover the full point spread function.
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