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Ernst Ruska and Max Knoll developed electron optics while improving the writing spot of a cathode-ray oscilloscope.^[ref] A structured object tests image formation more strongly than a single bright spot: each feature must retain its own image position.

On 7 April 1931, a cold cathode source and two short magnetic coils imaged aperture grids at $50\mathrm{kV}$. A platinum grid preceded the first coil; a bronze grid preceded the second. The fluorescent screen showed one-stage grid images and the first grid reimaged through both stages. Comparing these patterns tested successive image formation, not merely beam concentration. Heating could destroy even metal grids. This prototype did not establish resolution beyond an optical microscope.^[ref]

In 1933, Ruska measured $3\mathrm{mm}$ focal lengths at $75\mathrm{kV}$ with a pole-piece lens, then built an instrument giving $12000$-fold magnification.^[ref] TU Berlin dates images surpassing conventional optical microscope resolution to 1933.^[ref]

A fluorescent screen converts the spatial Electron distribution into visible light.^[ref] A collector reporting only total electric current would discard that spatial pattern. In a two-stage image relay, the first lens makes an intermediate real image; the second treats that image as its object. The diagram below illustrates this geometry with invented distances and an ideal beam.

An electron microscope forms a spatially enlarged representation of a specimen using Electrons, electron lenses, and a detector. Its appeal is access to structure too fine for an ordinary optical microscope, but a short de Broglie wavelength alone does not guarantee fine electron microscope resolution. Increasing magnification can enlarge an existing blur without revealing any additional structure.

In transmission electron microscopy, an electron gun illuminates a thin specimen; magnetic electron lenses form and enlarge its transmitted image on a fluorescent screen or detector. A vacuum reduces collisions with gas. Lens electric currents control focusing and magnification.^[ref]

Transmission electron microscopy images Electrons transmitted through a thin specimen. Electron diffraction from a selected region supplies complementary information about its atomic arrangement. A useful transmitted signal requires suitable specimen thickness.^[ref]

The image also depends on which outgoing Electron directions reach the detector. Transmission electron microscopy contrast makes this selection explicit: changing the objective aperture can change an image without changing the specimen. Interpreting the result requires electron diffraction, a specified detector response and measurement calibration.