Diode characteristic measurement

The New Jersey Institute of Technology laboratory uses a silicon 1N4148 diode. For its forward current-voltage characteristic, the supply operates in current-source mode; a benchtop voltmeter independently reads the diode electric potential difference. Small electric current steps resolve the steep branch. For reverse measurements, a sensitive ammeter sits in series; the handout suggests a $10$–$100\mathrm{k\Omega }$ series resistor. Reversing the applied polarity supplies the comparison. Meter placement must avoid counting the voltmeter's own electric current, and the zero reading may have an offset. The same diode is then measured with an Agilent U2722A source measure unit for graphical comparison.^[ref]

The prescribed analysis uses a logarithmic scale for forward electric current to infer $I_S$ and $n$ from the straight region. Large-electric current departures can indicate series electrical resistance. The handout cautions that the accessible range may not determine it precisely; meter loading also matters. This is a measurement procedure, without a published set of device readings.^[ref]

The reason for the logarithmic scale follows directly from the Shockley diode equation. If $I_D\gg I_S$ and series electrical resistance is negligible,where $I_0>0$ is a fixed reference electric current making the logarithm dimensionless. The slope is $1/(n{V}_T)$, so extracting $n$ needs the junction temperature. Fitting only an appropriate interval matters: a straight-looking subset cannot establish the model at all electric currents.