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Joining p-type and n-type regions initially allows majority carriers to diffuse across and recombine. Exposed negative acceptor charge on the p side and positive donor charge on the n side form a depletion region. Its electric field points from n to p and balances diffusion at equilibrium. The Fermi level is then spatially constant, while the conduction and valence band edges bend across the built-in potential; this equilibrium barrier cannot supply continuous power to a load.

forward bias makes p positive relative to n, reducing the barrier from $q{V}_{bi}$ to $q(V_{bi}-V)$. electrons enter p material and holes enter n material, becoming minority carriers whose diffusion and recombination sustain the current. reverse bias enlarges the barrier and leaves a much smaller minority-carrier current until breakdown. The ideal diffusion model gives $I=I_0[e^{qV/k_{B}T}-1]$, the Shockley diode equation; depletion-region recombination, series resistance and breakdown limit this approximation. Minority-carrier injection on both sides is essential to the junction theory.^[ref]

Donor doping supplies conduction electrons to n-type semiconductor; acceptor doping supplies holes to p-type semiconductor. In the nondegenerate, fully ionized limit, majority densities are approximately $n_n=N_D$ and $p_p=N_A$, while minority densities follow $np=n_i^2$. On contact, majority carriers diffuse across the junction, exposing positive donor ions on the n side and negative acceptor ions on the p side. The depletion-region electric field points from n to p and opposes further diffusion. At thermal equilibrium the Fermi level is uniform and drift balances diffusion, with no net current.

For an abrupt junction with uniform doping and permittivity ${\epsilon }_s$, charge neutrality gives $N_D{x}_n=N_A{x}_p$. Poisson's equation then givesPositive applied $V$ means forward bias: it lowers the barrier and narrows the depletion region. Most depletion width lies in the more lightly doped side. The formula assumes the depletion approximation and fails once its operating assumptions break down.

forward bias increases minority densities at the depletion edges by the factor $e^{qV/k_{B}T}$. In the neutral material, the steady diffusion–recombination equation gives exponentially decaying excess minorities, with lengths $L_n=\sqrt{D_n{\tau }_n}$ and $L_p=\sqrt{D_p{\tau }_p}$. Taking the carrier gradients at the junction yieldsThis ideal diode law assumes low injection, nondegenerate statistics, negligible depletion-region recombination and series resistance, and sufficiently long neutral regions. Its exponential comes from the bias-dependent injection barrier; there is no universal abrupt “turn-on” voltage. reverse bias suppresses injection, giving an approximate $-I_S$ current until additional leakage or breakdown matters.^[ref]

Rectification uses the asymmetric current-voltage characteristic; controlled reverse breakdown enables voltage references, with current limiting. Bias-dependent depletion capacitance enables varactors. photodiodes and solar cells collect optically generated carriers through the junction field and diffusion toward it; efficient light-emitting diodes use radiative electron–hole recombination, preferably in a direct-gap material. Series resistance, high injection, trap-assisted recombination, heating and finite carrier storage explain departures from the ideal steady-state law.

A p-n junction brings p-type and n-type regions into contact. Majority-carrier diffusion initially leaves exposed ionized acceptors and donors, producing a depletion region and a built-in potential. At thermal equilibrium the electrochemical potential is constant: drift and diffusion currents cancel. The internal barrier is not a freely extractable battery voltage.

For a nondegenerate abrupt homojunction,Here $V>0$ denotes forward bias and the depletion approximation is assumed. forward bias lowers the barrier and injects minority carriers; reverse bias widens the depleted region and suppresses ordinary majority injection. In the ideal diffusion regime,Recombination can change the ideality factor; series resistance, high-level injection, leakage and breakdown limit this simple Shockley diode equation. The original junction theory explicitly treats both electron and hole currents, which is essential to carrier injection and transistor action.^[ref]

As a rectifying diode, the junction conducts strongly in one bias direction and weakly in the other before breakdown. This permits power rectification, signal detection and electronic switching. Stored minority charge affects turn-off time, so a static exponential current-voltage relation alone does not specify switching speed. A junction capacitance $C_j\simeq {ϵ}_{s}A/W$ varies with reverse bias and can be used in a voltage-controlled capacitor; heavily doped or high-field junctions can instead exploit controlled tunnelling or avalanche breakdown.

In a photodiode, absorbed photons generate electron-hole pairs and the depleted-region field assists collection. reverse bias widens the collecting region and can improve speed, but adds dark-current noise and breakdown constraints. In a solar cell, the same carrier generation supplies current against an external voltage. An ideal illuminated characteristic is $I=I_s(e^{qV/(k_{B}T)}-1)-I_{\mathrm{ph}}$: at open circuit the forward diode current balances photocurrent, while useful power is taken at an intermediate operating point. Neither short circuit nor open circuit delivers power to a load.

A forward-biased light-emitting diode injects electrons and holes that can recombine radiatively. Efficient emission favors suitable direct-gap materials and carrier confinement; the characteristic photon energy is near the semiconductor band gap. nonradiative recombination, escape losses, series resistance and heating limit efficiency. Two coupled junctions also form a bipolar junction transistor: an emitter injects minority carriers through a thin base, and a reverse-biased collector collects them. Useful current gain depends on efficient injection and limited base recombination, not simply on joining any three arbitrary regions.

These functions are experimentally distinguished by measuring dark and illuminated current-voltage curves, bias-dependent capacitance, transient switching or optical emission, with controlled temperature and current limits. The common mechanism is bias-controlled carrier injection or collection at a depletion barrier; the device geometry and operating mode determine which function is useful.