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For harmonic electric fields with time convention $e^{i\omega t}$, write $\mathbf{D}={ϵ}^{\ast }(\omega )\mathbf{E}$ for their complex amplitudes, where $\omega$ is angular frequency. The real part ${ϵ}^{\prime }$ describes the in-phase electric displacement field; the minus imaginary part ${ϵ}^{\prime \prime }$ describes the loss component. The sign reverses with the opposite time convention. Complex permittivity can also be a tensor in a linear anisotropic dielectric.

For a plane wave proportional to $e^{i(N\omega z/c-\omega t)}$, the complex refractive index separates phase propagation from attenuation. In a nonmagnetic medium $N^2={ϵ}_r$, so $n^2-{\kappa }^2={ϵ}_r^{\prime }$ and $2n\kappa ={ϵ}_r^{\prime \prime }$. The passive branch has $\kappa \ge 0$. If $\kappa \ll n$ and ${ϵ}_r^{\prime }>0$, then $n\simeq \sqrt{{ϵ}_r^{\prime }}$ and $\kappa \simeq {ϵ}_r^{\prime \prime }/(2\sqrt{{ϵ}_r^{\prime }})$. These signs assume the $e^{-i\omega t}$ convention for the complex permittivity.

With phasor convention $e^{-i\omega t}$, the Ampere-Maxwell law in a scalar conductor reads $\nabla \times \mathbf{H}=(\sigma -i\omega {\epsilon }_0{\epsilon }_r)\mathbf{E}$. Factoring $-i\omega {\epsilon }_0$ gives the displayed effective relative complex permittivity. Its positive imaginary conductive term expresses loss in this convention; the sign reverses for $e^{+i\omega t}$. This combines conduction and displacement currents for the same field and must not be confused with the material's loss-free relative permittivity alone.

The motivating observation is that inserting an insulating material between fixed capacitor plates increases its capacitance. ^[ref]. To investigate this response, use two flat parallel metal electrodes with measured overlapping area $A$ and separation $d$, a uniform specimen filling the gap, and an instrument that measures electrical impedance. Record the capacitance with and without the specimen at the same small applied electric potential difference, frequency and temperature, after capacitance measurement calibration. An increase in corrected capacitance indicates a larger permittivity, provided the geometry is unchanged. A guard electrode reduces the contribution of the fringing field of a capacitor. ^[ref].

For negligible dielectric loss in the parallel-plate capacitor approximation,An air reference approximates $C_0$; it is not an exact vacuum reference. For the following synthetic example, stipulate $A=0.010{\mathrm{m}}^2$, $d=1.00\mathrm{mm}$ and the rounded vacuum permittivity ${ϵ}_0\approx 8.854\times 10^{-12}F/m$. Then $C_0=88.54\mathrm{pF}$ in this model, and relative permittivity four gives $C=354.16\mathrm{pF}$. A residual parallel capacitance of $20\mathrm{pF}$ would make an uncorrected sample/reference ratio $374.16/108.54\approx 3.447$, rather than four. This additive error does not cancel in a ratio.

At nonzero frequency $f$, measure both magnitude and phase of the electric current relative to the applied electric potential difference. Define $Y=I/V=1/Z$, where $Z$ is electrical impedance. For the stated complex permittivity convention, the ideal uniform specimen givesThus a parallel capacitor and electrical conductance describe the readout at that frequency; a single scalar capacitance cannot describe both components. The diagram's assumed dielectric relaxation gives $C_p=265.62\mathrm{pF}$ and $C_0{ϵ}_r^{\prime \prime }=88.54\mathrm{pF}$ at $1\mathrm{kHz}$. These are model predictions, not observations.

Repeat the reference measurement after removing the specimen and vary the small applied electric potential difference to test drift and linearity. Record specimen thickness, electrode area, contact conditions, frequency and temperature. Air gaps act as additional layers in series and can lower inferred relative permittivity; roughness, uncertain thickness and the fringing field of a capacitor limit the geometric formula. At sufficiently high frequency, the fixture itself changes the electromagnetic field, so low-frequency guarding and a lumped capacitor model require reassessment. ^[ref].

Delayed adjustment of electric polarization after a change in electric field. A simple illustrative model lets the slowly adjusting part ${\mathbf{P}}_s$ obey $\tau d{\mathbf{P}}_s/dt+{\mathbf{P}}_s={ϵ}_0\Delta {ϵ}_r\mathbf{E}$, with a positive response time $\tau$. A harmonic electric field then gives a contribution $\Delta {ϵ}_r/(1+i\omega \tau )$ to complex permittivity divided by vacuum permittivity. This model is an assumption, not a claim that all dielectrics have one response time.

Set $D=({\omega }_0^2-{\omega }^2{)}^2+{\gamma }^2{\omega }^2$. The real part and imaginary part of the complex permittivity areFor positive frequency the loss part is nonnegative. The real part starts at $1+{\omega }_p^2/{\omega }_0^2$, rises below resonance, falls steeply through the resonance region, and approaches one from below at high frequency. The imaginary part is a positive absorption peak near ${\omega }_0$, tending to zero on both sides.

For a nonmagnetic medium write its complex refractive index as $N=n_r+i\kappa$, with $N^2={ϵ}_r$ and optical extinction coefficient $\kappa$. In a transparent region with $\kappa \ll n_r$ and ${ϵ}_r^{\prime }>0$,The real part controls phase velocity and optical dispersion; the loss part controls wave absorption and the cycle-averaged dissipated power density $\omega {ϵ}_0{ϵ}_r^{\prime \prime }|E_0{|}^2/2$. Weak damping gives a narrow line but does not make wave absorption weak at its centre. The transparent-medium approximation applies away from the line.

Permittivity describes how an electric field and a material's electric polarization combine into the electric displacement field. In a static, local response with linearity and isotropy, and no electric polarization at zero electric field, the constitutive equation isHere ${ϵ}_0$ is vacuum permittivity, while ${ϵ}_r$ is the relative permittivity, a dimensionless quantity. The SI unit of permittivity is farad per metre, $F/m$: multiplying it by an electric field in $V/m$ gives an electric displacement field in $C/{\mathrm{m}}^2$. A larger positive permittivity lets the same parallel-plate capacitor hold more plate electric charge at the same electric potential difference.

The material contribution is electric polarization $\mathbf{P}$, the electric dipole moment per unit volume. The electric displacement field and electric susceptibility ${\chi }_e$ satisfySubstitution gives the first constitutive equation. The electric field here is the averaged, total field inside the material, not just the field of the external plate electric charges. The continuum approximation averages over many chemical atoms or molecules; locality means that the electric polarization at a position depends on the electric field there. Static equilibrium, fixed material conditions and sufficiently small electric fields are needed for this scalar proportionality. ^[ref].

For an ideal parallel-plate capacitor completely filled by a uniform dielectric, hold the free plate electric charge magnitude $Q$ fixed and neglect the fringing field of a capacitor. Writing $A$ for the plate area, Gauss's law gives $D=Q/A$. ThusThe electric dipoles point along the electric field. Their surface electric charges, described by polarization density, oppose the field from the free plate electric charges. For a hypothetical dielectric with ${ϵ}_r=4$, the internal electric field is one quarter of its vacuum value, while $P=3D/4$. At fixed electric potential difference instead, the internal electric field stays approximately $V/d$ and the plate electric charge grows fourfold. These are different experimental constraints. ^[ref].

Permittivity is a useful material summary, not a universal constant of the material under every condition. Temperature, frequency and electric field strength can change the response. In a linear anisotropic dielectric, permittivity is a tensor, $D_i={\sum }_j{ϵ}_{ij}{E}_j$, so the electric displacement field need not be parallel to the electric field. At nonzero frequency, delayed electric polarization requires complex permittivity and may produce dielectric loss. ^[ref].