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Nondegenerate carrier product. Assume three-dimensional parabolic energy bands near their extrema, spin degeneracy two, and no additional uncounted valley multiplicity. Near the conduction edge, a Boltzmann approximation to the Fermi-Dirac distribution givesAngular integration and the Gaussian radial integral yieldFor valence electron holes, the empty-state probability is $1-f(E)\simeq e^{(E-\mu )/(k_{B}T)}$. Measuring electron hole kinetic energy downwards from $E_v$ similarly givesThe factors two count spin once in each band. Multiplying cancels the chemical potential and proves the semiconductor mass-action law:In an intrinsic neutral semiconductor, $n=p=n_i$. In a doped equilibrium semiconductor the same product holds under the stated nondegenerate assumptions, even when $n\ne p$. Extra valleys or several valence branches must be included in the effective density-of-states factors rather than counted inconsistently.

Equilibrium junction. Put the p region on the left and the n region on the right. Before contact their majority carriers are electron holes and Electrons, respectively. Diffusion initially sends Electrons from n to p and electron holes from p to n. This leaves negative ionized acceptors on the p side and positive ionized donors on the n side, creating a depletion region and an electric field directed from n to p. At equilibrium this field balances diffusion, so the net electric current vanishes.

For a homojunction the gap remains constant while the conduction band and valence band edges bend downwards from p to n by $e{V}_{\mathrm{bi}}$. The equilibrium chemical potential is flat. Since $E_{c,v}(x)=E_{c,v}^{\mathrm{ref}}-e\varphi (x)$, the electrostatic potential rises from p to n. The carrier profiles satisfyWith fully ionized nondegenerate dopants, the neutral p side has $p_p\simeq N_A$, $n_p\simeq n_i^2/N_A$, while the neutral n side has $n_n\simeq N_D$, $p_n\simeq n_i^2/N_D$. Thus the Electron concentration rises across the junction and the electron hole concentration falls, with both small relative to the far-side majority densities in much of the depleted region. The ideal depletion approximation neglects these mobile populations when calculating the fixed space electric charge, but the actual equilibrium profiles are smooth.

The built-in potential follows from these Boltzmann factors:There is no applied terminal bias; the internal electrostatic potential variation does not contradict a constant electrochemical potential.

Opposing carrier fluxes under reverse bias. Use $V>0$ for the magnitude of reverse bias and $I>0$ for reverse electric current, as in the PDF. The junction barrier increases by $eV$. The Shockley diode equation in that orientation can be writtenThe reverse-directed contribution is supplied by minority Electrons on the p side and minority electron holes on the n side. They reach the depletion edge by diffusion and are swept across by the built-in field. The opposing contribution is associated with majority carriers thermally crossing the barrier in the forward direction; reverse bias suppresses it by the Boltzmann factor. At zero bias detailed balance makes the two equal, while at large enough reverse bias the opposing flux becomes negligible.

In the ideal neutral-region diffusion model,Here $D_n,D_p$ are minority-carrier diffusion coefficients, $L_n,L_p$ their diffusion lengths, and $\mathcal{A}$ is junction area. The two terms inside this positive prefactor are the Electron and electron hole contributions; both flow in the same reverse-current direction. This separates the two carrier-species contributions from the two opposing fluxes in the Shockley diode equation. Calling the saturation term a drift current refers to its passage across the depleted region, and does not eliminate the minority-carrier diffusion needed to supply it.

Reading the measured curves. At $eV\ll k_{B}T$, the ideal equation gives $I\simeq I_{\mathrm{sat}}eV/(k_{B}T)$, initially proportional to reverse electric potential difference. At $eV\gg k_{B}T$, it approaches a plateau $I\simeq I_{\mathrm{sat}}$. The thermal electric potential differences at the three temperatures are about $21$–$26\mathrm{mV}$, consistent with a rise at small reverse biases and near saturation at larger ones. Higher temperature produces a much larger plateau because thermal electron-hole excitation raises $n_i^2$ exponentially.

The lower-temperature curve has a noticeable residual electric potential difference dependence rather than a perfectly flat plateau. Depletion-region generation, surface leakage or other departures from the ideal diffusion model can contribute. The sharp upturn at the largest reverse electric potential differences is reverse breakdown, outside the unextended Shockley diode equation; the plot alone does not identify a unique microscopic breakdown mechanism. The original horizontal axis duplicates the final decade label, so a precise breakdown electric potential difference cannot be read reliably. Neither issue prevents estimating the gap from the intermediate-bias saturation region.

Band-gap estimate. Use plateau electric currents at a common intermediate reverse bias, away from both the small-bias rise and the breakdown upturn. Approximate readings are $I_{\mathrm{sat}}(298\mathrm{K})\sim 2.5\times 10^{-6}\mathrm{A}$, $I_{\mathrm{sat}}(273\mathrm{K})\sim 1.5$–$2\times 10^{-7}\mathrm{A}$, and $I_{\mathrm{sat}}(248\mathrm{K})\sim 10^{-8}\mathrm{A}$. Kelvin temperatures are required in the activation law.

For fixed effective masses, $n_i^2\propto T^3{e}^{-E_g/(k_{B}T)}$. If the remaining transport prefactor is approximately constant, extracting a semiconductor band gap from diode saturation current therefore usesUsing the widest temperature separation and the rounded readings givesNeglecting all algebraic prefactors and fitting $\ln I_{\mathrm{sat}}$ instead gives about $0.70\mathrm{eV}$. These differ by roughly $0.07\mathrm{eV}$, a material correction on the graph's precision scale. Thus an honest graph-based conclusion isThe nonflat low-temperature plateau, rough electric current readings, unprovided temperature dependence of $D/L$, and possible gap variation prevent a more precise extraction. If depletion-region generation dominated rather than the specified $I_{\mathrm{sat}}\propto n_i^2$ mechanism, its activation slope could involve a different energy scale; the displayed estimate explicitly uses the diffusion-dominated saturation model requested here.

Equilibrium junction. Put the p-type side on the left and n-type side on the right. When they are joined, Electrons diffuse from n to p and electron holes diffuse from p to n. This leaves negative ionized acceptors on the p-side and positive ionized donors on the n-side of the depletion region. The resulting built-in electric field points from n to p, opposing further diffusion. At equilibrium there is one constant Fermi level, and drift and diffusion currents cancel for each carrier species.

In the nondegenerate, fully ionized limit, the neutral-region carrier densities areThe conduction band and valence band lie higher on the p-side and bend down towards the n-side. The gap between them stays fixed for a homojunction. If $\psi$ increases towards the n-side, both edges shift by $-e\psi$, whileThus $n$ rises and $p$ falls continuously across the junction; neither mobile population is an exact step function. Their depletion exposes fixed dopant charge density, rather than an absence of every kind of charge. The built-in voltage is

Light emission. Forward bias lowers the barrier and injects minority carriers across the p-n junction. In a light-emitting diode, electron-hole recombination converts some of their energy into photons. A direct band gap permits efficient radiative transitions with nearly conserved crystal momentum; nonradiative channels compete. Near-edge emission has $\hslash \omega \simeq E_g$ and $\lambda \simeq hc/E_g$. Material composition and confinement select the emission colour. Reverse-bias saturation is not the ordinary LED operating mode.

Reverse current. Take $V=V_R>0$ and $I_R>0$ to mean reverse voltage and reverse current magnitudes. The Shockley diode equation in this convention isThe bias-independent $I_S$ term is the supply of thermally excited minority carriers from the neutral regions, swept across the junction by its electric field. The opposing injection current is reduced by the extra barrier energy $e{V}_R$ and is $I_S{e}^{-e{V}_R/(k_{B}T)}$. Their equality gives zero net current at zero bias; for $e{V}_R\gg k_{B}T$, the reverse current approaches $I_S$ until leakage or breakdown invalidates this ideal law. The collecting field need not create the minority carriers; their thermal supply limits the diffusion-dominated current.

For an ideal long junction of area $\mathcal{A}$, steady diffusion with recombination gives the diode minority-carrier diffusion currentIt depends on doping, geometry, carrier diffusion coefficients and lifetimes, and especially the intrinsic carrier concentration. Depletion-region generation current and surface leakage can add nonideal contributions to the measured reverse current.

Band-gap estimate from the data. Read a nearly flat region well above the small-bias knee and below the high-bias upturn, rather than estimating $I_S$ in the breakdown region. For a diffusion-dominated junction with nearly temperature-independent gap and effective masses,so $I_S=C(T)T^3{e}^{-E_g/(k_{B}T)}$, where $C(T)$ includes transport and doping factors. Extracting a semiconductor band gap from diode saturation current amounts to measuring the slope of $\ln [I_S/(C(T)T^3)]$ against $1/T$: it is $-E_g/k_B$. If the prefactor is taken approximately constant over a short interval,Approximate readings from the original PDF plateaus areUsing the two warmer curves and $k_B=8.6173\times 10^{-5}eV/K$ givesKeeping the $T^3$ factor but taking the residual transport factor constant changes this estimate to approximately $0.57\mathrm{eV}$. The justified graphical estimate is thereforeThe colder curve is a genuine limitation of the supplied data: the $0$ to $-45{}^{\circ }\mathrm{C}$ pair gives only about $0.32\mathrm{eV}$ with a constant prefactor, and the endpoint pair gives about $0.42\mathrm{eV}$. Thus all three cannot support one precise diffusion-only activation slope. A depletion-region generation current, approximately proportional to $n_i$ rather than $n_i^2$, can have a roughly half-gap activation energy; other leakage and temperature-dependent transport can also alter the slope. The PDF alone does not identify their relative contributions. A reliable precision gap measurement would use more temperatures and verify the transport regime instead of forcing one fit through these three readings.

An ideal diffusion-dominated p-n junction obeys the Shockley diode equationwith diode ideality factor $\eta =1$ in the simplest model. Forward bias gives exponential current growth; reverse bias gives a nearly constant $-I_s$ until diode reverse breakdown, outside this ideal expression.

For a long abrupt p-n junction in low carrier injection, the diode saturation current isHere $\mathcal{A}$ is area, $N_D,N_A$ are ionized dopant densities, and $D,L$ are minority-carrier diffusion coefficients and diffusion lengths in the appropriate regions. At each temperature, extract $I_s$ either from the reverse-saturation plateau below breakdown or from a forward exponential fit using its measured diode ideality factor.

Extracting a semiconductor band gap from diode saturation current requires correcting for the transport prefactor:A plot against $1/T$ has slope $-E_g/k_B$ when the gap and effective masses are nearly temperature-independent. Alternatively divide the measured $I_s$ by a known $C(T)$ to recover the full $n_i^2(T)$. The prefactor cannot generally be assumed constant over an arbitrarily broad range. Junction-generation or recombination-dominated current can scale as $n_i$ instead, so the diffusion regime should be identified from the current-voltage behaviour.