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An image stack is an ordered collection of related two-dimensional images treated as one dataset. Its index may denote cutting depth, time or another acquisition coordinate: stacking images does not by itself establish a spatial volume. The ImageJ guide distinguishes ordinary stacks from datasets with several independent axes and requires equal image dimensions and bit depth within an ordinary stack.^[ref]

For an original spatial example, store 100 grayscale images as an array $I[k,j,i]$ with shape $(100,512,512)$, where $k$ indexes sections and $i,j$ index pixels. If each value occupies two bytes, the raw data requireThis excludes metadata and compression. Define the image stack axis calibration explicitly: at lateral pixel pitch $p=5\mathrm{nm}$ and section spacing $\Delta z=40\mathrm{nm}$, a zero-origin convention isThe first and last section centers are $99\Delta z=3.96\mu \mathrm{m}$ apart. Array shape alone does not contain that information.

An index permutation can preserve every stored intensity yet exchange depth and lateral coordinates, giving the wrong geometry if the spacing metadata are not permuted too. Image registration estimates alignment between slices; image segmentation assigns structural labels. Neither operation supplies a missing section's observations. For datasets exceeding memory, an image stack can also be read a slice at a time; the guide's virtual-stack representation keeps the image sequence on disk.^[ref]

Image stack axis calibration assigns physical coordinates to the indices of an image stack. It states what each axis means, its spacing, origin and orientation. Pixel indices, section indices and frame indices are distinct from positions and times. In ImageJ, image properties include pixel width, pixel height, voxel depth and frame interval; its Origin fields are expressed in pixels.^[ref]

For an original general spatial model, let the index vector be $\mathbf{n}=(i,j,k{)}^T$ and definewhere ${\mathbf{r}}_0$ is a physical origin and $R$ is a rotation matrix. This is an affine map; the rotation represents a chosen acquisition-to-world orientation rather than a claim that ImageJ's Properties dialog implements an arbitrary rotation. Convert any pixel-unit origin into the chosen physical convention before using this equation.

Take spacings $(s_x,s_y,s_z)=(0.2,0.3,1.0)\mu \mathrm{m}$, origin ${\mathbf{r}}_0=(10,-4,2)\mu \mathrm{m}$ and a 90° rotation about the positive third axis:Index $(3,2,1)$ first maps to local displacement $(0.6,0.6,1.0)\mu \mathrm{m}$ and then to world position $(9.4,-3.4,3.0)\mu \mathrm{m}$. Its distance from the physical origin is $\sqrt{0.6^2+0.6^2+1^2}\simeq 1.31\mu \mathrm{m}$, unchanged by the rotation.

Cropping and axis permutation require corresponding metadata changes. If a crop begins at old index $\mathbf{c}$, its new physical origin is ${\mathbf{r}}_0^{\prime }={\mathbf{r}}_0+R\mathrm{diag}(s_x,s_y,s_z)\mathbf{c}$. For irregular section positions, store those positions explicitly instead of inventing one uniform depth increment. Image resampling may alter the grid, but it does not create independently acquired depth information.

Microtomy prepares thin physical sections with a microtome, exposing interior structure for microscopy. The knife separates a layer from a supported specimen while a controlled feed determines the nominal depth increment. Physical section thickness, section orientation and cutting-induced deformation all enter the interpretation of an image. Ultramicrotomy is the specialized thin-section technique used in applications such as transmission electron microscopy.

The preparation method also serves materials research. Yale's instrument description lists a Leica Ultra UC7 with a trimming mill and glass knife maker, and identifies polymers, material fibres and soft metals among suitable specimen materials.^[ref] Manufacturer guidance discusses polymer blends and composite materials, along with the possibility of section compression and cutting artifacts.^[ref]

A useful teaching experiment would compare cuts through a straight, known circular material fibre at different section orientations. A normal vector to the cut aligned with the fibre axis gives a circular profile. An oblique cut gives an ellipse even when the fibre has suffered no deformation. Image the recovered sections with an optical microscope, measure profile dimensions with an established image stack axis calibration, and record the angle between the section's normal vector and the fibre axis. This tests the geometry of the section rather than assuming that every measured elongation is a physical distortion.

For an original ideal calculation, model the fibre boundary as an infinite circular cylinder of radius $R$, with axis along the unit vector $\mathbf{u}=(\sin \theta ,0,\cos \theta )$, where $0\le \theta <\pi /2$. Parallel section planes have equation $z=z_0$. The squared Euclidean distance to the axis is $(x\cos \theta -z\sin \theta {)}^2+y^2$, obtained by subtracting the squared axial orthogonal projection from $x^2+y^2+z^2$. At the section plane, the boundary therefore satisfiesThis oblique section of a circular cylinder is an ellipse with semi-major and semi-minor axes and areaThe area of an ellipse gives the last expression. For chosen $R=20\mu \mathrm{m}$ and $\theta =45^{\circ }$, the semi-major and semi-minor axes are approximately $28.28\mu \mathrm{m}$ and $20.00\mu \mathrm{m}$. The profile area is $\sqrt{2}$ times the perpendicular-profile area, an increase of about 41.4 percent entirely explained by section orientation.

The center of an ellipse in this model has $x$ coordinate $x_c(z_0)=z_0\tan \theta$. In an ordered image stack, two sampled section planes separated by $h$ consequently have lateral centre displacement $\Delta x=h\tan \theta$. At the chosen $h=20\mu \mathrm{m}$ and $\theta =45^{\circ }$, this displacement is $20\mu \mathrm{m}$. Here $h$ is the spacing between sampled planes, which can differ from the physical section thickness if some sections are not imaged.

The calculation assumes a circular, straight fibre, known section geometry and negligible physical section thickness relative to resolved features. One elliptical profile alone cannot distinguish an oblique circular fibre from a differently shaped fibre or an unknown deformation. Comparing known reference features and following their positions through an image stack provides additional evidence. Image registration can align images, but an inferred shift may contain real specimen geometry as well as instrument motion; removing every shift would erase the tilt information in this example.

Nominal section feed is the intended advance of specimen relative to knife between successive cutting strokes of a microtome. It specifies a machine setting or commanded increment. It is distinct from the recovered physical section thickness, which can change through cutting and handling, and from the separation of sections selected for an image stack.

JEOL describes presenting the block to a diamond knife by a preset advance and then making the cutting stroke. It also notes that material hardness and environmental temperature can cause recovered sections to differ from the preset thickness.^[ref] Consequently the feed record is useful acquisition metadata but does not independently verify thickness.

An original acquisition ledger illustrates a changing feed. Let the ideal block face before cutting be at $z_0=0$, and stipulate successive feed commands of $60,60,100,60\mathrm{nm}$. If motion follows each command exactly, successive cutting planes lie atIf images represent the newly exposed faces after cuts 1 and 4, their separation is $f_2+f_3+f_4=220\mathrm{nm}$, not three times the initial $60\mathrm{nm}$ setting. This statement concerns block-face positions. For images assigned to centres of collected slabs, the coordinate convention must also account for their thicknesses: in this ideal example, centres of slabs 1 and 4 are $30$ and $250\mathrm{nm}$, a separation of $220\mathrm{nm}$, while centres of slabs 2 and 3 are $90$ and $170\mathrm{nm}$, separated by $80\mathrm{nm}$ rather than their face spacing of $100\mathrm{nm}$.

Retain feed changes, cutting order, omitted images and the coordinate convention used by the image stack axis calibration. Independently measuring specimen advance tests the feed mechanism; measuring recovered physical section thickness tests a different outcome. Backlash or thermal expansion can affect the first, while section compression and other deformation can affect the second. The ideal ledger assumes neither kind of discrepancy.

Physical section thickness is the distance through a recovered physical section, measured normal to its faces. For a flat section with parallel faces, write this distance as $t$; a nonuniform section instead requires a local thickness or a stated averaging convention. It is distinct from the nominal section feed commanded to the microtome, the spacing of sampled planes in an image stack, and the spatial resolution of the resulting image.

In ultramicrotomy, a controlled advance presents material to a diamond knife on each cutting stroke. JEOL describes preset feed increments for thin sections and notes that actual thickness depends on the material and temperature.^[ref] Section compression and other deformation can further complicate the relation between the machine setting and the recovered section. A feed setting alone is not an independent thickness measurement.

An original geometric example shows why finite thickness matters. Consider a straight thin feature whose direction makes angle $\theta$ with the section's normal vector. Choose coordinates so the section occupies $0\le z\le t$ and the feature lies alongAn image combining contributions through the section can therefore contain feature positions spanning the lateral distanceFor stipulated $t=100\mathrm{nm}$ and $\theta =30^{\circ }$, this range is $57.7\mathrm{nm}$. It is a geometric range, not a universal formula for the measured image width: image contrast, the imaging response and the feature's own width also matter. Replacing the slab by one mathematical plane discards this depth variation.

For an ideal undeformed series of contiguous $100\mathrm{nm}$ sections, imaging every fifth section gives a centre-to-centre sampling interval of $500\mathrm{nm}$, while each imaged section remains $100\mathrm{nm}$ thick. Record omitted sections and the image stack axis calibration separately. To test a feed setting experimentally, measure recovered thickness with an independent method and stated measurement uncertainty, rather than using the same feed display as both command and verification.

Ultramicrotomy prepares extremely thin physical sections by advancing a specimen block through a controlled increment and cutting across it with an ultramicrotome. A diamond knife or suitable glass knife removes the section; collected sections can then be examined by transmission electron microscopy. The instrument's feed setting and the geometry of the recovered section are related quantities, but they need not be equal. JEOL explicitly notes dependence on specimen material and temperature.^[ref]

For a materials example, consider a polymer block containing an initially $20.0\mu \mathrm{m}$-long marked interval parallel to the cutting direction. Suppose the recovered section measures $17.0\mu \mathrm{m}$ along that interval, with unchanged transverse width. Its section compression is $1-17/20=15\%$. Under an explicitly ideal volume-conserving model, a nominal $60\mathrm{nm}$ layer would then have recovered thicknessThe altered area and thickness give the same model volume: $0.85\cdot 70.6\simeq 60$. This is an original diagnostic calculation, not a universal correction rule. Material loss, transverse strain or nonuniform deformation would invalidate the model.

A motivating preparation check therefore compares dimensions of recognizable material features before cutting and in the recovered section, while recording cutting direction and specimen conditions. An independent thickness measurement tests whether the feed is a good depth calibration. Image registration can align section images but cannot generally reverse unknown physical deformation. For serial-section electron microscopy, preserve section order and gaps in the image stack as well as the chosen image stack axis calibration.