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A device that amplifies a particle signal through repeated production of secondary electrons.

A scanning electron microscope scans a focused Electron probe across a specimen and assigns a detector signal to each probe position. Secondary electrons leaving the irradiated region often reveal surface relief; backscattered electrons can provide composition-dependent contrast. Image brightness records the selected signal, rather than a transmitted projection enlarged by two lenses. Display enlargement is therefore set by the ratio of display width to scanned specimen width. Surface geometry and composition both affect brightness.^[ref]