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Suppose the two input beams share frequency, electromagnetic polarization and overlapping transverse profiles at each output, with stable relative wave phase during the photodetector's averaging interval. For the ideal beam splitter scattering matrix above, expanding the squared complex amplitudes givesThe imaginary part terms describe wave interference. Applying the single-input power split to each input separately and adding the results would discard these terms. Their opposite signs ensure $P_1+P_2=|a_1{|}^2+|a_2{|}^2$: conservation of energy survives even when one output is dark.

For an original example, let $a_1=\sqrt{P}$, $a_2=\sqrt{P}{e}^{i\delta }$ and $P=1\mathrm{mW}$. Then $P_1=P(1-\sin \delta )$ and $P_2=P(1+\sin \delta )$:

At $+\pi /2$, $a_2=i\sqrt{P}$ makes $b_1=(\sqrt{P}-\sqrt{P})/\sqrt{2}=0$ and $b_2=i\sqrt{2P}$; at $-\pi /2$ the dark output swaps. Thus the two inputs can feed all their combined power into one output without gain. At zero relative input wave phase, the splitter's own relative wave phase leaves the contributions in quadrature, so neither output is dark.

For fluctuating fields, average the cross term as $\mathrm{Im}⟨a_1^{\ast }{a}_2⟩$. It vanishes for mutually uncorrelated inputs, making the independent power-splitting rule valid for the averaged output. Partial first-order optical coherence reduces it. Orthogonal linear polarizations eliminate the cross term in a polarization-insensitive power readout, and spatial mismatch reduces the overlap. Detector averaging can also erase rapid relative wave phase changes. A fixed relation between two inputs can be prepared by splitting one laser beam and recombining the two arms.

An actual teaching protocol in Michelson Interferometer & Precision Wavelength Measurement — Week 1, University of Colorado Boulder, §§4–6, starts with an ideal-model prediction, then builds a Michelson interferometer using a helium-neon laser, a nonpolarizing beam splitter, adjustable mirrors, a micrometer translation stage and a photodetector. Steering mirrors align beam overlap at near and far planes; far-plane interference fringes refine alignment. Moving the arm mirror changes the returning relative wave phase; detector voltage is watched with a live acquisition display or oscilloscope. The guide compares measured arm powers with 50:50 splitting and asks for a revised field model. It tests electromagnetic polarization dependence, optionally changing one arm with a quarter-wave plate, and estimates noise from repeated readings at fixed mirror position. These controls test whether fringe changes reflect coherent recombination rather than splitter imbalance or misalignment. The guide supplies a protocol, not a numerical dataset. Its detector noise, imperfect overlap and electromagnetic polarization mismatch limit displacement inference.^[ref]

Additional background subtraction controls follow from the field model: block both arms to record the detector offset and ambient light, then unblock each arm separately to establish its detected power at fixed gain. With both open, scan the mirror and compare extrema after subtracting that background. Keep the detector below saturation and repeat the scan to check drift. A changing signal alone cannot distinguish source optical coherence from motion or changing overlap. For a vacuum round trip, a mirror displacement $x$ changes relative wave phase by $4\pi x/\lambda$; the useful signal is its modulation after detection, not an optical-frequency oscillation that the detector must resolve.

For the overlapping monochromatic wave components, let $d$ be the thickness and ${\lambda }_0$ the vacuum wavelength. Define $\Delta n=n_s-n_f>0$ using the slow and fast refractive indices. With complex amplitude convention $e^{i(kz-\omega t)}$, the accumulated slow-minus-fast phase difference isThis is the optical path difference $\Delta nd$ expressed as a wave phase. It is a signed accumulation convention; with the opposite time convention the sign reverses. The outgoing polarization of an electromagnetic wave depends on $\delta$ modulo $2\pi$. Here the positive slow-minus-fast $\Delta n$ differs from the signed principal-index $n_e-n_o$ used in the parent birefringence entry when $n_e<n_o$.

For an original worked example, stipulate $\Delta n=0.0100$ at ${\lambda }_0=600\mathrm{nm}$ and a uniform thickness $d=15.0\mu \mathrm{m}$. These are design assumptions, not measured material data. The optical path difference is $150\mathrm{nm}$, soIt is a quarter-wave plate. At the same wavelength and refractive indices, doubling $d$ to $30.0\mu \mathrm{m}$ gives $\delta =\pi$, a half-wave plate. A $1.0\mu \mathrm{m}$ thickness increase changes $\delta$ by $\pi /30$, or $6^{\circ }$; retaining the same birefringence at $500\mathrm{nm}$ would instead give $\delta =3\pi /5$ for the $15.0\mu \mathrm{m}$ plate. Real refractive indices also vary with wavelength, so this last calculation explicitly neglects optical dispersion.

For these equal transmitted wave amplitudes, orthogonal projection onto a polarizer crossed with the initial $45^{\circ }$ linear polarization gives a simple independent readout. After removing a common wave phase, the component complex amplitudes are proportional to $(1,e^{i\delta })/\sqrt{2}$; orthogonal projection onto $(1,-1)/\sqrt{2}$ gives $(1-e^{i\delta })/2$. Squaring its modulus yields $I_{\perp }/I_{\mathrm{in}}={\sin }^2(\delta /2)$: zero at $d=0$, one half at $15\mu \mathrm{m}$, and one at $30\mu \mathrm{m}$. This assumes ideal polarizers, negligible specular reflection and wave absorption, overlapping components and stable relative wave phase. It measures a periodic function of phase retardation, so one brightness measurement cannot determine the thickness uniquely.

A quarter-wave plate gives a quarter-cycle phase retardation. Equal transmitted wave amplitudes initially in linear polarization at $45^{\circ }$ become circular polarization; unequal wave amplitudes generally give elliptical polarization. Reversing the sign reverses the traversal of the same circle.