Bragg angle 2026-10-18
The Bragg angle is the glancing angle from the incident beam to the selected lattice planes, with . If is instead the angle from the beam to the plane normal, and Bragg's law becomes . Defining the angle explicitly prevents a sine-versus-cosine error as well as a factor-of-two error in the detector deflection.
Choose and as an illustrative model, not historical measurements. For the first diffraction order,
The second diffraction order has and ; the third would require and is impossible. These are different diffraction orders of the same interplanar spacing at the same wavelength.
Conversely, a first-order reflection at a measured deflection gives the interplanar spacing
Using recovers . This is the useful reversal: a known wavelength turns an angular measurement into an atomic length. An unassigned diffraction order or an unknown wavelength prevents that single measurement from determining uniquely.
William Lawrence Bragg introduced the plane interpretation; his father William Henry Bragg built the X-ray spectrometer. Their joint 1913 paper, The Reflection of X-rays by Crystals, reports the experiment. [ref] [ref]
An X-ray tube supplied radiation through lead slits to a crystal mounted with its cleavage face through the rotation axis. A rotating ionization chamber replaced a spectrometer telescope; electric current measured the scattered signal, and a circular scale supplied angular readings. They first scanned the chamber at fixed crystal orientation, then swept crystal and chamber together to follow the reflection. [ref]
Changing chamber gas checked detector dependence; readings on opposite sides checked face-setting errors. Repeated peaks with sines of half-deflections in integer ratios, together with matching absorption coefficients, distinguished repeated diffraction orders of the same wavelength from different radiation components. Comparing crystal faces constrained interplanar spacings. Their limits included slit broadening, face alignment and incomplete interception at glancing incidence; assigning absolute wavelengths still required a structural choice for . [ref]
Bragg's law Created 2026-10-14 Updated 2026-10-18
Bragg's law selects directions of constructive interference in coherent elastic scattering from equally spaced lattice planes:
Here is the perpendicular interplanar spacing, the incident wavelength, the positive integer diffraction order, and the Bragg angle, measured between the incoming beam and the lattice planes. The scattering deflection, between incoming and outgoing propagation directions, is . Thus a plotted detector angle must be halved before insertion into Bragg's law. The in the parent elastic Bragg scattering condition denotes the full deflection; the present denotes half of it. [ref]
The lattice planes organize wave interference throughout a crystal structure; they are not literal metal mirrors or separate reflecting surfaces. The picture assumes elastic scattering, hence an unchanged wavelength, and sufficiently stable relative wave phases across the contributing lattice planes. X-ray wavelengths comparable with atomic interplanar spacings make these directions experimentally accessible. The sine cannot exceed one: an order exists geometrically only if . For , even the first diffraction order is inaccessible. A geometrically possible direction need not have nonzero wave intensity; the crystal lattice structure factor and crystal basis structure factor also matter. [ref]
William Lawrence Bragg's 1913 structure paper connects a slit-selected beam, an oriented crystal and an ionization chamber to strength-versus-angle curves. Repeated sine ratios and matching absorption coefficients identify common radiation. Narrower slits resolve blended lines. Absolute wavelengths remain undetermined there; intercrystal comparisons first give relative scales. The Bragg crystal reflection experiment of 1913 covers the alignment controls.[ref]
William Henry Bragg's 1915 Bakerian lecture, X-rays and Crystal Structure, separates the geometric and intensity arguments. Its Figure 9 compares reflection positions and strengths from three sodium chloride orientations; odd and even diffraction orders differ in strength along one orientation. The interpretation uses alternating scattering layers. Later, the calcite example identifies an internal oxygen coordinate that symmetry alone cannot fix. Improved wave intensity measurements revise a previously rough estimate. Thus a lattice assignment can precede determination of positions inside the unit cell; intensity interpretation also has experimental and theoretical limits. This is the father's 1915 lecture, distinct from the joint 1913 reflection paper.[ref]
Differentiate Bragg's law at fixed correctly assigned diffraction order:
Divide the second equality by the first. For small signed changes,
The Bragg angle error must be in radians. An error quoted for detector deflection must first be halved. The expression is a first-order Taylor expansion; an unknown diffraction order is a discrete assignment error, not an infinitesimal perturbation.
For error bounds, add magnitudes. For independent zero-mean random errors with standard deviations , variance addition instead gives
Correlated errors require a covariance term. A shared calibration bias does not become independent merely because many line positions are measured.
With a chosen angular error arcseconds, , the angular contribution is at and at . Larger Bragg angles reduce this contribution because decreases. For a nearby spectral doublet, the inverse relation is : a fixed fractional separation spreads farther apart angularly at large Bragg angle.
This does not permit unlimited improvement. The geometry requires ; a desired wavelength might not have an accessible large-angle reflection with the chosen crystal. Higher diffraction orders can reach larger Bragg angles but their strengths depend on the crystal lattice structure factor. Finite crystal response, slit widths and source size remain relevant. An error in , including uncorrected thermal expansion, remains even when the angular term is small. Very near , the leading angular derivative vanishes and the second-order Taylor expansion matters.
Choose a primitive cubic lattice with , one identical point scatterer per primitive unit cell, incident direction , and the continuous wavelength band . This is a hypothetical model, not the zinc blende specimen of the Laue X-ray diffraction experiment of 1912. Write a candidate reciprocal lattice vector as with , and set . The Laue equations and elastic scattering give
A transmission photographic plate at intercepts only . Its coordinates relative to the direct beam are
For and , , and , so . Its length is one, and each component difference satisfies the corresponding Laue equations. This verifies a direction and a selected wavelength, without predicting an exposure or measured wave intensity.
Figure 1.
Calculated white-beam Laue method spots and their response to crystal tilt
. Original calculation for the stated primitive cubic lattice and a square detector with . Left: the cubic direction is along the incident beam. Right: rotate the same crystal structure by about the laboratory axis, keeping source and detector fixed. Color gives the selected wavelength; equal marker sizes convey positions rather than wave intensities. Harmonic reflections can overlap. Neither panel copies, simulates the chemistry of, or fits an experimental plate. Source. Details.
The first panel has fourfold symmetry because its chosen Bravais lattice, beam axis and square detector share that symmetry. For the tilted panel, apply a rotation matrix to each index vector, set , and use and . All indices with suffice: elastic scattering bounds . Thus the plotted spectral and angular selection is complete within this ideal point model and detector window. Multiples of an index vector select inversely scaled wavelengths and can land on the same spot; a white-beam spot need not identify a unique diffraction order.
A cross-dispersed echelle spectrograph uses an echelle grating for strong dispersion and a cross-disperser in the perpendicular direction to separate overlapping diffraction orders. It records many orders simultaneously in an echellogram.
A crystal X-ray spectrometer selects a narrow wavelength interval by diffraction at known interplanar spacing and Bragg angle . For fixed diffraction order , a known lets an angular measurement determine . This reverses the crystallography problem of finding from a known wavelength.
Siegbahn's laboratory developed X-ray tubes and evacuated spectrographs for longer wavelengths. Rotating the crystal selected reflections; photographic plates recorded positions. Opposite-side exposures measured angles on both sides of the direct beam. Later tube instruments mounted a beam-defining slit opposite the plate holder. A separate double instrument compared two reflected beams with two ionization chambers. These were different instruments, not one universal assembly.[ref]
The Nobel biography describes constant-temperature spectrographs and a precision angular scale read by diametrically opposed microscopes.[ref] Temperature control matters because thermal expansion changes ; an accurately read angle cannot compensate for an unknown interplanar spacing.
Figure 1. . Original functional schematic, not a reconstruction of a particular Siegbahn instrument. Two slits illustrate collimation; the selected incident direction, rotatable crystal and movable readout define the geometry. The Bragg angle is measured from the lattice planes; the beam deflection is . The photographic plate and scanning ionization chamber are alternative readouts. Component sizes, angles and positions have no historical scale. Details.
The schematic separates preparation, selection and readout. An X-ray tube target supplies Characteristic X-rays with a possible bremsstrahlung background. A collimator limits incident directions; evacuation reduces air X-ray attenuation. Rotating the crystal brings different wavelengths into reflection. A photographic plate stores line positions over an exposure, whereas an ionization chamber can measure collected electric charge at successive angles. Neither readout alone establishes absolute wavelength: an angular zero, angular-scale calibration, diffraction order, and any required refraction correction enter the inference. Narrower slits reduce accepted angular spread but also reduce signal; a weak line can become harder to locate despite a narrower instrumental response.
A control reported in Siegbahn's lecture photographed a line system with copper-sulphate and calcium-sulphate crystals. Irregular relative shifts around copper's characteristic frequency supported anomalous dispersion; the arrangement excluded differing absorption across that frequency as the explanation.[ref] A finer angular scale alone cannot remove this physical refraction correction.
Diffraction grating Created 2026-10-05 Updated 2026-10-14
A diffraction grating is a periodic optical structure whose repeated slits or grooves direct light into diffraction orders through wave interference. Its beauty is that many individually broad contributions cooperate to select narrow directions: the spacing determines where the principal peaks occur, while the number of illuminated elements determines how sharply they are selected. This makes a diffraction grating useful in a spectrometer, where separating wavelengths spatially lets us examine an optical spectrum. [ref].
Consider a transmission diffraction grating in air, illuminated at normal incidence by a plane wave. Let be the centre-to-centre slit spacing, the wavelength in the surrounding medium, and the signed outgoing angle from the forward normal. In Fraunhofer diffraction, where observation directions specify the far-field pattern, adjacent contributions have path difference and phase difference . Their wave amplitudes reinforce whenever , giving . This normal-incidence geometry should be kept distinct from the incident and reflected angle convention in the grating equation below. [ref].
Angular colour separation follows immediately. At fixed nonzero diffraction order, increasing the wavelength moves the peak farther from the normal. With , first-order light at leaves at , whereas leaves at : a separation of . The zero diffraction order stays at for both wavelengths. Thus grating dispersion comes from an orderly dependence of wave interference on wavelength, rather than an arbitrary assignment of colours to directions.
Figure 1.
Normal-incidence diffraction orders at and first-order angular colour separation
. Details.
For identical slits with uniform coherent illumination, meaning stable relative wave phases across the array, the normalized wave interference factor is
The apparent at a principal peak has limiting value one. A short explanation uses the geometric series: equal wave phases add equal complex amplitudes; a small directional change distributes those contributions around the complex plane and allows cancellation. With each slit's contribution held fixed, peak scalar wave intensity scales as . The normalized plots remove that height change to make the narrowing visible. Stable relative wave phases, or optical coherence, are essential; a sum of independent intensities would lose this array structure. [ref].
For finite slit width , the ideal rectangular-slit model multiplies by a broad single-slit diffraction envelope:
The sinc function factor, extended continuously at , controls the brightness available to the narrow peaks. For example, gives envelope values about , , and at diffraction orders , , and in the example. If an envelope zero coincides with an allowed diffraction order, that peak disappears. A permitted direction therefore need not produce a visible bright spot. [ref].
Historically, Joseph von Fraunhofer used fine parallel wires stretched between threaded rods to make diffraction gratings. Kenyon's historical apparatus account describes both this construction and a later reconstruction with visible light. The example makes the governing idea tangible: regular spacing can turn a simple array of obstacles into an instrument for distinguishing wavelengths. [ref].
Diffraction order Created 2026-10-05 Updated 2026-10-18
A diffraction order is the integer labeling a principal constructive interference direction of a diffraction grating: adjacent elements differ in path length by wavelengths. In the normal-incidence transmission geometry described above,
Positive and negative diffraction orders lie on opposite sides of the forward normal. The condition expresses the range of the sine of a real angle, so it also limits the propagating diffraction orders.
For and , . Taking the inverse sine gives
These are seven allowed propagating diffraction orders. Order would require , and would require , so neither has a propagating far-field direction. The allowed diffraction orders are equally spaced in , while their actual angles become farther apart toward grazing propagation.
Each principal peak has finite width. For the ideal uniform coherent array, the nearest zeros around order obey
Thus the one-sided distance from the order direction to the first zero is . Near the first diffraction order in our example, puts the zeros at and , while puts them at and . The respective one-sided widths are and ; the full zero-to-zero widths are and . These are calculated coherent peak widths, with the slit envelope omitted, and do not describe a measured instrument response. [ref].
Figure 1.
Single-slit diffraction envelope and calculated first-order peak widths for and
. Details.
Four times as many illuminated slits therefore give a fourfold narrowing in this coordinate without moving the diffraction order. That sharper directional selection helps distinguish nearby wavelengths in a spectrograph. Actual performance also depends on illumination, optical coherence, and source width; the separate slit-limited resolving power of a grating describes the contribution of the entrance slit.
Echelle grating 2026-10-05
An echelle grating works in high diffraction orders. A separate cross-disperser separates their overlapping optical spectra on a two-dimensional detector.
Echellogram 2026-10-05
An echellogram is the two-dimensional detector pattern of separated diffraction orders from a cross-dispersed echelle spectrograph.
Electron diffraction Created 2026-10-14 Updated 2026-10-20
Electron diffraction is interference between scattered electron probability amplitudes. It connects the de Broglie wavelength of the incident beam to the arrangement of the scattering material. In elastic scattering from a fixed crystal, , and constructive crystal scattering selects wavevector transfers in the reciprocal lattice. The physical momentum transfer to the electron is in this convention.
Bragg's law expresses the same condition as , where is the spacing of the chosen lattice planes, the diffraction order, and the angle to those planes. The angle between incoming and outgoing propagation directions is for that reflection geometry. In normal-incidence backscattering, a detector's angle from the outward surface normal instead gives ; neither detector colatitude nor angle to the surface normal should silently replace . A finite-row electron diffraction model uses a different spacing, the spacing between sites along a surface row, and makes that distinction explicit.
ELODIE spectrograph 2026-10-18
Built by André Baranne, Michel Mayor, Didier Queloz and colleagues, the ELODIE fiber-fed spectrograph carried light from Haute-Provence's 1.93-metre telescope through optical fibers. Its echelle grating dispersed light in high diffraction orders; an optical prism and grism cross-disperser separated them perpendicularly on a charge-coupled device. This cross-dispersed echelle spectrograph achieved spectral resolving power . A simultaneous thorium reference tracked instrumental drift. Wavelength calibration mapped detector positions to wavelengths; spectral cross-correlation combined many spectral lines into a fitted profile. A barycentric velocity correction removed the observer's motion.[ref]
Figure 1.
ELODIE measurement chain and synthetic radial-velocity readout
. Original schematic; the correlation profile and periodic signal are synthetic. Details.
Why can a spectrograph measure a Doppler shift much smaller than one spectral resolution element? Resolution concerns separating neighbouring features, whereas locating the centre of a known profile uses information across that profile and across many spectral lines. For a chosen example, at a recession velocity of gives
At , one spectral resolution element corresponds to , about times larger. A well measured centre can move by a small fraction of that width. More photons and more useful spectral lines improve the estimate, but do not remove wavelength calibration errors or stellar activity.
A simple mathematical picture of spectral cross-correlation makes the readout concrete. Define , with fixed reference wavelength , and let be continuum-normalized line absorption. For small velocities, a common Doppler shift approximately translates . A positive absorption mask then gives
If , the maximum occurs at ; a convention correlating the received observed radiative flux instead produces a dip. A fitted correlation centre is an effective collective line position, not a claim that each individual spectral line has been resolved into a narrower feature. The lamp tracks instrumental drift, while the barycentric velocity correction removes the observer's changing line-of-sight velocity; neither removes changes in the star itself.
Finite-row electron diffraction model Created 2026-10-14 Updated 2026-10-20
Take equally spaced scattering sites at on a line, a normally incident plane wave, equal site scattering amplitudes, and observation far enough away that outgoing directions are effectively parallel. Retain only one scattering event per amplitude, as in the Born approximation. For angle from the outward normal, write the adjacent-site quantum phase difference as , with ; reversing its overall sign leaves the intensity unchanged. Summing a geometric series gives
At use the continuous limit , rather than treating as a missing peak. The integer is the diffraction order: . This is a surface-row spacing, not the plane spacing in Bragg's law. The plotted intensity is normalized to its central value; it is not an integrated detection probability or an absolute collector electric current.
Figure 1.
Surface-row geometry and calculated electron diffraction intensity
. Original idealized model: , row spacing , equal site scattering amplitudes, normal incidence and field-free nonrelativistic electron wavelengths at , and . Straight arrows denote propagation directions, not sinusoidal particle paths. The first-order peak angles are about , and . Curves are calculated phase sums, not measured data or a fit to the Davisson–Germer experiment. Source. Details.
At , and the positive first-order angle is . At , the wavelength halves and this angle becomes about . Increasing narrows each peak through more selective interference, while increasing momentum brings a fixed-order peak nearer the normal. Unequal site amplitudes, multiple scattering, a three-dimensional crystal lattice structure factor, and finite detector acceptance can change this simple picture; it is an explanatory model with hypothetical inputs.
A spectral doublet comprises two neighbouring spectral lines. Resolving it requires information about the line response, relative strengths and noise, not only precision in reading an angle. Choose two equal angular responses shaped as Gaussian functions with common standard deviation and separation . If is angular displacement from their midpoint, their summed signal is
These are assumed response shapes, not a measured Siegbahn frequency spectrum. By symmetry , and
The midpoint changes from a maximum to a minimum at . For this particular equal-width, equal-height model, two distinct maxima occur when . Each isolated Gaussian function has full width at half maximum ; the two-maxima threshold is therefore about times that width.
Figure 1.
Angular error and the visibility of a chosen spectral doublet
. Original calculated models. Left: magnitude of the angular term in Bragg wavelength error propagation, alongside a separately chosen fractional spacing error of parts per million; the curves are not added. Right: explicitly chosen interplanar spacing , first diffraction order, and lines at and . Equal Gaussian function responses use angular standard deviations and ; dotted curves show the narrower isolated components. None of these numbers is a historical crystal calibration or measured spectrum. Details.
In this chosen model, the two Bragg angles are and . Their separation is times for , giving one maximum, and times for , giving two. Sharpening the response can reveal the doublet without changing either emitted wavelength.
The Rayleigh criterion uses a first-zero convention for specified diffraction patterns. A Gaussian function has no finite zero, so its two-maxima threshold is not the Rayleigh criterion. Neither convention is a universal inference limit: known response shapes and adequate signal-to-noise ratio can support estimating a separation before two visible maxima appear. Unequal strengths, background, finite sampling and uncertainty in the response can make that inference much harder. Measurement resolution, the precision of an isolated line's centre and absolute wavelength accuracy should therefore be reported separately.
Holography 2026-10-18
Holography records the wave interference between a holographic object wave and a known holographic reference wave, then uses that record to reconstruct a wavefront. The record is a hologram. A photographic plate or photodetector measures light intensity; the relative wave phase is encoded in the positions and contrast of interference fringes, rather than measured directly as an optical oscillation. Reillumination makes the recorded pattern act as a diffraction grating that produces an image-bearing field.
The useful change of viewpoint is to preserve a field that can propagate again, instead of only a focused brightness picture. Recovered complex amplitude permits refocusing with the Fresnel propagator; a spatially extended hologram can also supply different viewing directions. The recoverable information is limited by the collected aperture, recorded spatial frequencies, optical coherence and separation of unwanted diffraction orders.
Interplanar spacing 2026-10-18
The interplanar spacing is the perpendicular distance between parallel planes in a specified family. Measuring along an oblique line gives a larger distance, so the direction of measurement matters.
There is a short reciprocal lattice derivation. With the angular convention , put . Then is the same plane equation as . Thus is a normal vector. Moving between consecutive sheets along this normal changes the dot product by , giving
For perpendicular cubic axes of length , this becomes
For example, choose a primitive cubic lattice with . Its lattice planes have . This is a chosen geometry, not an experimental value. The distance from a point to a plane gives the same result: the planes and in ordinary Cartesian length coordinates are separated by .
Specify whether denotes spacing between successive occupied lattice planes or the formal spacing assigned to a reflection label. In a primitive cubic lattice, has formal spacing but every other sheet contains no lattice points; its reflection is the second diffraction order of . In a face-centered cubic lattice with conventional cubic axes, the sheets at half-integer do contain lattice points. Here is the actual spacing of the complete family perpendicular to that cube edge. The Primitive cubic Bragg peak positions example explains how to avoid counting a reflection twice.
Zhu, Miao, Xu and Cao's 2007 experiment drove a triangular metal frame electromagnetically with a sinusoidal generator. In a roughly -deep, temperature-regulated pool, it produced nearly plane capillary waves. A laser illuminated the surface obliquely; the moving ripples acted as a reflection diffraction grating. One split beam monitored laser stability, while a CCD recorded diffraction orders on a screen away. An air-supported optical table reduced ambient vibration. [ref]
Figure 1. . An original schematic of excitation and optical detection, with ray angles and surface displacement exaggerated for readability. The right panel calculates the deep-water dispersion relation for the stipulated parameters in capillary length; the – band identifies a drive range to compare with the documented experiment. No diffraction intensities, measured points or fitted surface tensions are plotted. Details.
The frequency sweep was – in steps, using distilled water and kerosene at . For each setting they averaged at least three measurements of first-order spot separation. Known optical geometry and the grating equation yielded ; generator readings yielded . Agreement with the predicted log–log slope tests the capillary law, and its intercept gives surface tension if mass density is known. The authors identify surface contamination as a major error source; noncontact optical detection reduces additional disturbance. [ref]
The optical measurement can be understood from the grating equation. Let be the laser wavelength, the incident grazing angle above the mean surface, and the outgoing grazing angle of diffraction order , with the sign of chosen so that
Thus calibrated spot positions determine outgoing angles, which determine the ripple wavelength , independently of the mechanical dispersion relation. This optical geometry treats the surface as a reflection diffraction grating at the laser wavelength. [ref]
The inferred surface tension in the full deep-water model is
This formula makes useful experimental controls explicit. Measure mass density at the sample's temperature; check depth with ; keep the driven wave amplitude small enough that ; and distinguish from angular frequency . For the stipulated parameters, the – window corresponds to calculated wavelengths about – and – at . Depth corrections are negligible here, but the gravity contribution is about – of the capillary contribution. These are ideal predictions, not digitized results from the experiment.
Omitting gravity would infer , biasing surface tension upward. In the capillary limit, the differential estimate also shows why careful spot-spacing calibration matters. A clean surface and weak viscosity are modeling assumptions: appreciable damping, surfactant stresses or large wave amplitudes call for additional physics. The experiment tests the short-wave regime; its drive window does not establish the crossover or the long-wave surface gravity wave limit.
Choose an original simulated model: a primitive cubic lattice with one identical point scatterer per primitive unit cell, edge , and incident X-ray wavelength . These are stipulated lengths, not measurements of sodium chloride. Suppose orientation information has already assigned the two observed reflections the Miller indices and . The detector deflection is , where is the Bragg angle.
Use the existing interplanar spacing formula and Bragg's law, with higher diffraction orders absorbed into the reflection indices:
The simulated reflection has , hence . The reflection has , hence . Their squared sines are and , in ratio . Substituting the unrounded angles independently gives
Agreement tests a proposed indexing and scale together; disagreement would prompt checks of the indexing, wavelength, angular zero, or the assumed unit cell geometry.
Figure 1.
Two indexed reflections recover the same cubic repeat length
. Original simulation with and . Left: selected and positions on a detector-deflection axis; equal stick heights are only markers. Right: their squared sines lie on the line of slope . These are selected reflections, not a complete scan, a powder trace, or measured sodium chloride data. Details.
Two peak positions alone do not establish the indexing. Assigning the same two angles to and would give and instead. More reflections, orientation information and systematic absences help discriminate such assignments. An unobserved reflection can be inaccessible, weak or extinguished by the atomic basis; absence is not automatically evidence for a larger interplanar spacing.
Absolute scale also requires measurement calibration of the wavelength. To first order, differentiation of the inferred length gives
with angular changes in radians. A stipulated detector-zero error , with correct wavelength, biases the first inferred edge downward by approximately and the second by . A common angular offset therefore need not cancel when two inferred lengths are compared. These are model sensitivity estimates, not historical instrument uncertainties.